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ICTSS 2011: The 23th IFIP International Conference on Testing Software and Systems
November 7-10, 2011
Institut Henri Poincare, Paris, France http://ictss2011.lri.fr
CALL FOR RESEARCH, INDUSTRY PAPERS
Abstract submission: May 8, 2011
Paper submission: May 15, 2011
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Scope and Objectives
Testing is one of the most important technique for the (partial) verification of communication and software systems as well as the validation of their models. Testing, if done right, is known to be a laborious and very cost-intensive task during the development of such systems; in extreme cases, more than 70% of the development cost in industrial development processes were spent for testing. ICTSS is a series of international conferences addressing the conceptual, theoretic, and practical problems of testing software systems, including communication protocols, services, distributed platforms, middleware, controllers and security infrastructures. The ICTSS is the successor of previous (joint) conferences TESTCOM and FATES and aims at being a forum for researchers, developers, testers, and users to review, discuss, and learn about new approaches, concepts, theories, methodologies, tools, and experiences in the field of testing of communicating systems and software. The conference web-site related to this call can be found at http://ictss2011.lri.fr
Topics of interest
Topics of interest include but are not limited to, the following:
aspects of testing: test derivation, test selection, test coverage, test implementation and execution, test result analysis, test oracles, test management, monitoring and runtime verification, test frameworks;
model-based testing: formal models and modeling languages such as automata, state machines, process algebra, logics, SDL, UML, HOL, Markov-chains, test generation from models, model coverage;
application areas: communicating systems such as protocols, middleware, networks, Web services, wireless applications, control systems, business information systems, embedded and real-time software, etc.;
combinations of different testing techniques, in particular techniques for the automated generation of test data;
tools to support any of the testing activities;
case studies and industrial applications involving qualified empirical evaluations.
Types of Contributions
Research papers (max. 16 pages) describing results of theoretical or experimental research, which must be original, significant and sound.
Industrial papers (max. 16 pages) describing approaches and means to introduce new testing methodologies in industrial contexts or reporting on industrial best practices
Submission and publication
Original papers, not submitted for publication elsewhere, have to be submitted electronically in PDF format via easychair. All submissions have to follow the Springer LNCS paper format.
The submission type according to the categories mentioned under Types of Contributions must be stated explicitly by the author(s) upon submission via the conference website. The submission type influences the review criteria.
Accepted contributions must be presented at the conference. Accepted papers are published by Springer in the LNCS series. Authors need to sign a copyright transfer form to transfer usage rights on theirs papers to Springer.
Important Dates
Abstracts submission: May 8, 2011
Papers due: May 15, 2011
Notifications: July 13, 2011
Camera ready: July 30, 2011
ICTSS 2011 conference: November 7-10, 2011
Organization
Program Chairs:
Burkhart Wolff, University Paris-Sud XI, France
Fatiha Zaidi, University Paris-Sud XI, France
ICTSS 2011 Program Committee :
Paul Baker, Motorola, England
Achim Brucker, SAP Research, Germany
Antonia Bertolino, ISTI-CNR, Italy
Gregor V. Bochmann, University of Ottawa, Canada
Ana R. Cavalli, Telecom SudParis, France
Jim Davies, University of Oxford, UK
John Derrick, University of Sheffield, UK
Gordon Frazer, TU Graz, Austria
Jens Grabowski, University of Gottingen, Germany
Roland Groz, Grenoble INP, France
Wolfgang Grieskamp, Microsoft Research, USA
Toru Hasegawa, KDDI R&D, Japan
Rob Hierons, Brunel University, UK
Teruo Higashino, Osaka University, Japan
Dieter Hogrefe, University of Gottingen, Germany
Antti Huima, M.Sc. Tech, Finland
Thierry Jeron, IRISA Rennes, France
Ferhat Khendek, Concordia University, Canada
David Lee, Ohio State University, USA
Bruno Legeard, Leirios, France
Delphine Longuet, University of Paris-Sud XI, France
Stephane Maag, Telecom SudParis, France
Jose Carlos Maldonado, U of San Carlos; Brazil
Mercedes G. Merayo, University of Complutense de Madrid, Spain
Brian Nielsen, University of Aalborg, Danemark
Manuel Nunez, University of Complutense de Madrid, Spain
Doron Peled, University of Bar-Ilan, Israel
Alexandre Petrenko, CRIM, Canada
Antoine Rollet, University of Bordeaux 1, France
Ina Schieferdecker, Fraunhofer FOKUS, Germany
Adenilso da Silva Simao, University of San Carlos, Brazil
Kenji Suzuki, University of Electro-Communications, Japan
Nicolai Tillmann, Microsoft Research, USA
Andreas Ulrich, Siemens AG, Germany
Hasan Ural, University of Ottawa, Canada
Umit Uyar, City University of New York, USA
Margus Veanes, Microsoft Research, USA
Cesar Viho, IRISA Rennes, France
Carsten Weise, RWTH Aachen, Germany
Burkhart Wolff, University of Paris-Sud XI, France